reliability characterisation of electrical and electronic systems

Reliability Characterisation Of Electrical And Electronic Systems
Author: Jonathan Swingler
Publisher: Elsevier
Release Date: 2014-12-24
Pages: 274
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications. Takes a holistic approach to reliability engineering Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation

Reliability Characterisation Of Electrical And Electronic Systems
Author: Jonathan Swingler
Publisher: Woodhead Publishing
Release Date: 2020-11-15
Pages: 350
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

The book charts how reliability engineering has moved from the use of sometimes arbitrary standards to an empirical scientific approach of understanding operating conditions, failure mechanisms, the need for testing for a more realistic characterisation and, new for the second edition, includes the monitoring of performance/robustness in the field. Reliability Characterisation of Electrical and Electronic Systems brings together a number of experts and key players in the discipline to concisely present the fundamentals and background to reliability theory, elaborate on the current thinking and developments behind reliability characterisation, and give a detailed account of emerging issues across a wide range of applications. The second edition has a new section titled Reliability Condition Monitoring and Prognostics for Specific Application which provides a guide to critical issues in key industrial sectors such as automotive and aerospace. There are also new chapters on areas of growing importance such as reliability methods in high-temperature electronics and reliability and testing of electric aircraft power systems. Reviews emerging areas of importance such as reliability methods in high-temperature electronics and reliability testing of electric vehicles Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing

Impedance Source Inverters
Author: Hongpeng Liu
Publisher: Springer Nature
Release Date: 2020-01-13
Pages: 290
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

This book focuses on impedance source inverters, discussing their classification, advantages, topologies, analysis methods, working mechanisms, improvements, reliability, and applications. It summarizes methods for suppressing DC-link voltage spikes and duty loss, which can pose a problem for researchers; and presents novel, efficient, steady state and transient analysis methods that are of significant practical value, along with specific calculation examples. Further, the book addresses the reliability of impedance source inverters, adopting a methodology from reliability engineering to do so. Given its scope, it offers a valuable resource for researchers, engineers, and graduate students in fields involving impedance source inverters and new energy sources.

Materials Characterization Using Nondestructive Evaluation  NDE  Methods
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
Release Date: 2016-03-23
Pages: 320
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials

Prognostics And Health Management Of Electronics
Author: Michael G. Pecht
Publisher: John Wiley & Sons
Release Date: 2018-08-21
Pages: 800
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

An indispensable guide for engineers and data scientists in design, testing, operation, manufacturing, and maintenance A road map to the current challenges and available opportunities for the research and development of Prognostics and Health Management (PHM), this important work covers all areas of electronics and explains how to: assess methods for damage estimation of components and systems due to field loading conditions assess the cost and benefits of prognostic implementations develop novel methods for in situ monitoring of products and systems in actual life-cycle conditions enable condition-based (predictive) maintenance increase system availability through an extension of maintenance cycles and/or timely repair actions; obtain knowledge of load history for future design, qualification, and root cause analysis reduce the occurrence of no fault found (NFF) subtract life-cycle costs of equipment from reduction in inspection costs, downtime, and inventory Prognostics and Health Management of Electronics also explains how to understand statistical techniques and machine learning methods used for diagnostics and prognostics. Using this valuable resource, electrical engineers, data scientists, and design engineers will be able to fully grasp the synergy between IoT, machine learning, and risk assessment.

Thermal Management Of Electronic Systems II
Author: E. Beyne
Publisher: Springer Science & Business Media
Release Date: 2012-12-06
Pages: 361
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

For the second time, the Eurotherm Committee has chosen Thermal Managment of Electronic Systems as the subject for its 45th Seminar, held at IMEC in Leuven, Belgium, from 20 to 22 September 1995. After the successfui first edition of this seminar in Delft, June 14-16, 1993, it was decided to repeat this event on a two year basis. This volume constitutes the edited proceedings of the Seminar. Thermal management of electronic systems is gaining importance. Whereas a few years ago papers on this subject where mainly devoted to applications in high end markets, such as mainframes and telecommunication switching equipment, we see a growing importance in the "lower" end applications. This may be understood from the growing impact of electronics on every day life, from car electronics, GSM phones, personal computers to electronic games. These applications add new requirements to the thermal design. The thermal problem and the applicable cooling strategies are quite different from those in high end products. In this seminar the latest developments in many of the different aspects of the thermal design of electronic systems were discussed. Particular attention was given to thermal modelling, experimental characterisation and the impact of thermal design on the reliability of electronic systems.

Reliability Control For Electronic Systems
Author: Lacombe
Publisher: CRC Press
Release Date: 1999-05-14
Pages: 344
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

Demonstrates how electronic products manufacturers can improve the effectiveness and longevity of their finished products, building in reliability at the design state and more efficiently monitoring and controlling it throughout practice. The text addresses management personnel in small- and medium-sized electronics manufacturing concerns.

Safety And Reliability Of Programmable Electronic Systems
Author: Daniels
Publisher: Springer Science & Business Media
Release Date: 2012-12-06
Pages: 270
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

The use of programmable electronic systems (PES) in industry has grown considerably with the availability of microcomputers. These systems offer many benefits to the designer and user in providing more comprehensive control of industrial processes, enviroments, machine tools and in robot installations. As confidence grows with the application of PES, users and manufacturers are considering incorporating safety functions within the requirements and functions of the PES. This book represents the proceedings of the Programmable Electronic Systems Safety Symposium (PES-3) held in Guernsey, Channel Islands, May 28th - 30th 1986, which presented the guidance available to users, designers and safety assessors of programmable electronic systems. This guidance is applicable for many real and potential risk and safety situations in a wide variety of industries ranging from nuclear power plants and industrial robotics, to machine tools and chemical process controllers. The original impetus to hold the Symposium came from a two year collaborative project partially funded by the Commission of the European Communities under the 1979-83 Informatics Initiative. The sponsors of the Symposium studied the assessment, architecture and performance of industrial programmable electronic systems, with particular reference to robotics. The group of papers in the first session give the first public report of the results of this project. The session was Chaired by H Fangmeyer from the Commission's Joint Research Centre at Ispra, Italy, who was the Commission's Project Manager throughout the collaboration.

Materials And Reliability Handbook For Semiconductor Optical And Electron Devices
Author: Osamu Ueda
Publisher: Springer Science & Business Media
Release Date: 2012-09-24
Pages: 616
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.

Reliability Engineering
Author: Alessandro Birolini
Publisher: Springer Science & Business Media
Release Date: 2007-08-15
Pages: 593
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

This book presents the state-of-the-art of reliability engineering, both in theory and practice. It provides design guidelines for reliability, maintainability, and software quality. This is a textbook establishing a link between theory and practice, with a large number of tables, figures, and examples to support the practical aspects. This allows rapid access to practical results. The book is based on over 30 years of industrial and academic experience.

Issues In Electronic Circuits  Devices  And Materials  2011 Edition
Author:
Publisher: ScholarlyEditions
Release Date: 2012-01-09
Pages: 2452
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

Issues in Electronic Circuits, Devices, and Materials: 2011 Edition is a ScholarlyEditions™ eBook that delivers timely, authoritative, and comprehensive information about Electronic Circuits, Devices, and Materials. The editors have built Issues in Electronic Circuits, Devices, and Materials: 2011 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Electronic Circuits, Devices, and Materials in this eBook to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Issues in Electronic Circuits, Devices, and Materials: 2011 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.

Thermal Analysis Of Power Electronic Devices Used In Renewable Energy Systems
Author: Alhussein Albarbar
Publisher: Springer
Release Date: 2017-07-19
Pages: 218
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

This book analyzes the thermal characteristics of power electronic devices (PEDs) with a focus on those used in wind and solar energy systems. The authors focus on the devices used in such applications, for example boost converters and inverters under different operating conditions. The book explains in detail finite element modeling techniques, setting up measuring systems, data analysis, and PEDs’ lifetime calculations. It is appropriate reading for graduate students and researchers who focus on the design and reliability of power electronic devices.

Proceedings Of The IEEE 1978 National Aerospace And Electronics Conference  NAECON  78  Held At The Dayton Convention Center  May 16 18  1978
Author:
Publisher:
Release Date: 1978
Pages: 1376
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

IEEE International Reliability Physics Symposium Proceedings
Author: International Reliability Physics Symposium
Publisher:
Release Date: 2004
Pages:
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

1997 Reliability And Maintainability Symposium
Author: Reliability and Maintainability Symposium
Publisher:
Release Date: 1997
Pages: 370
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

Proceedings Of The     European Symposium On Reliability Of Electron Devices  Failure Physics And Analyses
Author:
Publisher:
Release Date: 1996
Pages:
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

Embedded Mechatronic Systems
Author: Abdelkhalak El Hami
Publisher: ISTE Press - Elsevier
Release Date: 2019-12-15
Pages: 280
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

Mechatronics brings together computer science, mechanics and electronics. It enables us to improve the performances of embedded electronic systems by reducing their weight, volume, energy consumption and cost. Mechatronic equipment must operate without failure throughout ever-increasing service lives. The particularly severe conditions of use of embedded mechatronics cause failure mechanisms which are the source of breakdowns. Until now, these failure phenomena have not been looked at with enough depth to be able to be controlled. Embedded Mechatronic Systems 1, Second Edition presents two methodologies: the statistical approach to the design optimization by reliability and the experimental approach for the characterization of the development of mechatronic systems in operating mode. It also analyzes new analysis tools on the effects of thermal, vibratory, humidity, electric and electromagnetic stresses. Presents a statistical approach to the design optimization by reliability It presents an experimental approach for the characterization of the development of mechatronic systems in operating mode The book analyzes new analysis tools on the effects of thermal, vibratory, humidity, electric and electromagnetic stresses

Solid State Lighting Reliability Part 2
Author: Willem Dirk van Driel
Publisher: Springer
Release Date: 2017-08-13
Pages: 606
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

In the past four years we have witnessed rapid development in technology and significant market penetration in many applications for LED systems. New processes and new materials have been introduced; new standards and new testing methods have been developed; new driver, control and sensing technologies have been integrated; and new and unknown failure modes have also been presented. In this book, Solid State Lighting Reliability Part 2, we invited the experts from industry and academia to present the latest developments and findings in the LED system reliability arena. Topics in this book cover the early failures and critical steps in LED manufacturing; advances in reliability testing and standards; quality of colour and colour stability; degradation of optical materials and the associated chromaticity maintenance; characterization of thermal interfaces; LED solder joint testing and prediction; common failure modes in LED drivers; root causes for lumen depreciation; corrosion sensitivity of LED packages; reliability management for automotive LEDs, and lightning effects on LEDs. This book is a continuation of Solid State Lighting Reliability: Components to Systems (published in 2013), which covers reliability aspects ranging from the LED to the total luminaire or system of luminaires. Together, these two books are a full set of reference books for Solid State Lighting reliability from the performance of the (sub-) components to the total system, regardless its complexity.

Electronic Engineering
Author:
Publisher:
Release Date: 1981-01
Pages:
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS:

5th Electronics Packaging Technology Conference
Author: Mahadevan K. Iyer
Publisher: IEEE Computer Society Press
Release Date: 2003
Pages: 827
ISBN:
Available Language: English, Spanish, And French
EBOOK SYNOPSIS: